opsira: Goniometer '2pi

3D Model

gonio‘2pi enables the professional and precise measurement of light source and luminaire characteristics (source imaging goniometer) as well as the scatter behavior (BSDF measurements) of materials and surfaces combined with a very high measurement dynamics. The goniometer is available in a source imaging (si) confi- guration, a scatter measurement configuration (bsdf) and in a complete version combining both approaches. si can be easily upgraded to bsdf or vice versa at a later stage. Compared to similar devices the opsira goniometers benefit from their very robust construction paired with a very high precision in the mechanical setup and from the reliable concept of zero backlash drives.

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